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Semi-conducteurs Industrie
The Practical Guide to Surface Science (2026)

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This is a practical guide to Surface Science for researchers working in the Semiconductors Industry.

Dans ce tout nouveau guide, vous apprendrez tout sur :

  • Crucial surface science principles
  • The significance of surface science measurements for the Semiconductors industry
  • Normes et directives ASTM applicables

Plongeons dans le vif du sujet.

Semi-conducteurs

Executive Summary

What it covers: A practical surface-science guide for semiconductor R&D and process engineers covering how and why to measure contact angle (static + advancing/receding), surface tension (static + dynamic), surface energy, and sliding angle. It links these measurements to process readiness, troubleshooting, and real manufacturing outcomes.
Key insights: Static contact angles can be misleading on real wafers/coatings—advancing and receding angles (and hysteresis) give a truer, more repeatable read on wettability, cleanliness, roughness, and heterogeneity. It also clarifies method tradeoffs (Young–Laplace profile fitting vs. polynomial fitting) and when dynamic surface tension matters (fast-changing interfaces like droplet formation, coalescence, and drying).
Business value: Improves yield and pattern fidelity by optimizing photoresist/substrate wetting and adhesion in lithography, reducing defects tied to poor surface readiness. Cuts reliability risks and rework in packaging by controlling adhesive flow/residue (sliding angle) and mitigates immersion-lithography failures by tuning fluid surface tension for better drainage/meniscus control.
Standards to follow: Use SEMI/ASTM D7490-13 (Reapproved 2022) to estimate solid surface free energy (total + polar/dispersive components) from two-liquid sessile-drop contact angles as a controlled, comparative “surface readiness” metric. For reproducibility, follow the guide’s reporting checklist: defined probe liquids, droplet volume, fixed capture timepoint, environment (T/RH), replicates/statistics, QC rules, and stated calculation model/liquid set.
Bottom line: This is a semiconductor-focused playbook for choosing the right surface measurement, running it in a controlled way, and interpreting results as process-control signals rather than universal material constants. Use it to set calibrated pass bands, spot contamination/treatment drift early, and tie surface metrics to downstream KPIs like adhesion, defects, and device reliability.

Chapitre 1 : Introduction

Semiconductor manufacturers face the constant challenge of maximizing performance and refining processes. Often underestimated, surface properties play a crucial role in optimizing these performances. By measuring these properties, we gain valuable insights into material properties, processes, and device performance, ultimately leading to:

 

Semi-conducteurs

We use the following surface properties to understand the behavior of Semiconductors products and improve their quality.

Chapitre 2 : Mesure de l’angle de contact

L’angle de contact quantifie la mouillabilité d’une surface en représentant l’angle entre la surface d’un liquide et une surface solide.
Recherche Dropletlab

Sample Image taken from Droplet Lab Tensiometer.

Young – Méthode Laplace

Méthode polynomiale

Angle de contact dynamique

Ideally, when we place a drop on a solid surface, a unique angle exists between the liquid and the solid surface. We can calculate the value of this ideal contact angle (the so-called Young’s contact angle) using Young’s equation. In practice, due to surface geometry, roughness, heterogeneity, contamination, and deformation, the contact angle value on a surface is not necessarily a single consistent value but rather falls within a range. The upper and lower limits of this range are known as the advancing and receding contact angles, respectively. The values of advancing and receding contact angles for a solid surface are highly sensitive to many parameters, such as temperature, humidity, homogeneity, and minor contamination of the surface and liquid. For example, the advancing and receding contact angles of a surface can differ at different locations.

Angle de contact dynamique par rapport à l’angle de contact statique

Les surfaces et les revêtements pratiques présentent naturellement une hystérésis d’angle de contact, indiquant une gamme de valeurs d’équilibre. Lorsque nous mesurons les angles de contact statiques, nous obtenons une seule valeur dans cette plage. S’appuyer uniquement sur des mesures statiques pose des problèmes, tels qu’une mauvaise répétabilité et une évaluation incomplète de la surface en ce qui concerne l’adhérence, la propreté, la rugosité et l’homogénéité.

In practical applications, we need to understand how easily a liquid spreads (advancing angle) and how easily it is removed (receding angle), such as in painting and cleaning. Measuring advancing and receding angles offers a holistic view of liquid-solid interaction, unlike static measurements, which yield an arbitrary value within the range.

Ces informations sont cruciales pour les surfaces du monde réel avec des variations, une rugosité et une dynamique, aidant des industries telles que les cosmétiques, la science des matériaux et la biotechnologie à concevoir des surfaces efficaces et à optimiser les processus.

Découvrez comment la mesure de l’angle de contact est effectuée sur notre tensiomètre

Pour une compréhension plus complète de la mesure de l’angle de contact, lisez notre mesure de l’angle de contact : le guide définitif

Open Benchmark Data: Contact Angle & Surface Energy

These reference measurements show how deionized water wets four standard substrates measured with the Droplet Lab Dropometer. Use them as visual and numerical benchmarks when you're checking your own sample preparation, treatments, and chemistry.

Full contact angle and surface energy datasets (including additional liquids and statistics) are available on our dataset hub.

Glass - DI Water
Glass - DI Water
Nylon - DI Water
Nylon - DI Water
PMMA - DI Water
PMMA - DI Water
Teflon - DI Water
Teflon - DI Water

The droplet images above are taken from the same benchmark series as our open dataset. For each substrate and probe liquid we report:

● Advancing and receding contact angles (and hysteresis)
● Derived surface energy (SFE) values based on multi-liquid measurements
● Measurement conditions, uncertainties, and sample preparation details

Comparing your own droplet shapes and angles against these references is a fast way to spot contamination, treatment drift, or unexpected changes in wettability.

Chapitre 3 : Mesure de la tension superficielle

Cette propriété mesure la force qui agit à la surface d’un liquide, dans le but de minimiser sa surface.

Mesure de la tension superficielle

Sample Image taken from Droplet Lab Tensiometer

Tension superficielle dynamique

La tension superficielle dynamique diffère de la tension superficielle statique, qui fait référence à l’énergie de surface par unité de surface (ou à la force agissant par unité de longueur le long du bord d’une surface liquide).

La tension superficielle statique caractérise l’état d’équilibre de l’interface liquide, tandis que la tension superficielle dynamique tient compte de la cinétique des changements à l’interface. Ces changements peuvent impliquer la présence de tensioactifs, d’additifs ou de variations de température, de pression et de composition à l’interface.

Quand utiliser la mesure dynamique de la tension superficielle

Dynamic surface tension is essential for processes that involve rapid changes at the liquid-gas or liquid-liquid interface, such as droplet and bubble formation, coalescence (change in surface area), the behavior of foams, and the drying of paints (change in composition, e.g., evaporation of solvent). It is measured by analyzing the shape of a hanging droplet over time.

La tension superficielle dynamique s’applique à diverses industries, notamment les cosmétiques, les revêtements, les produits pharmaceutiques, la peinture, l’alimentation et les boissons, ainsi que les processus industriels, où la compréhension et le contrôle du comportement des interfaces liquides sont essentiels pour la qualité du produit et l’efficacité des processus.

Apprenez comment la mesure de la tension superficielle est effectuée sur notre tensiomètre

Pour une compréhension plus complète de la mesure de l’énergie de surface, lisez notre mesure de la tension superficielle : le guide définitif

Chapitre 4 : Mesure de l’énergie de surface

L’énergie de surface fait référence à l’énergie nécessaire pour créer une unité de surface d’une nouvelle surface.
231

Sample Image taken from Droplet Lab Tensiometer

Découvrez comment la mesure de l’énergie de surface est effectuée sur notre tensiomètre

Pour une compréhension plus complète de la mesure de l’énergie de surface, lisez notre mesure de l’énergie de surface : le guide définitif

For benchmark contact angle and surface energy values on glass, nylon, PMMA, and Teflon, see the Open Benchmark Data panel above or visit our Dataset Hub for full CSV downloads.

Chapitre 5 : Mesure de l’angle de glissement

L’angle de glissement mesure l’angle auquel un film liquide glisse sur une surface solide. Il est couramment utilisé pour évaluer la résistance au glissement d’une surface.

Angle de glissement 1

Sample Image taken from Droplet Lab Tensiometer

Apprenez comment la mesure de l’angle de glissement est effectuée sur notre tensiomètre

Pour une compréhension plus complète de la mesure de l’angle de glissement, lisez notre Mesure de l’angle de glissement : le guide définitif

Chapitre 6 : Applications dans le monde réel

Within the Semiconductors industry, several case studies exemplify the advantages of conducting surface property measurements.

Photoresist Adhesion in Lithography

In photolithography, meticulous pattern creation is key to manufacturing complex semiconductor devices. This process relies heavily on the delicate interplay between the photoresist and the substrate. Photoresist adhesion to the substrate acts as a linchpin, directly determining the sharpness and precision of the resulting patterns. To achieve optimal results, manufacturers delve into the surface science of these properties. By examining the substrate's surface energy and analyzing the contact angle exhibited by the photoresist, they gain valuable insights to fine-tune adjustments.

This refining process enhances adhesion properties, ultimately leading to a seamless pattern transfer. The benefits are manifold, including increased yields, sharper results, and a significant reduction in defects throughout the lithography process.

Photoresist Adhesion in Lithography

Réduire les résidus d’adhésif dans l’emballage

Chip packaging relies heavily on adhesives to securely bind the delicate semiconductor die to its protective casing. However, a major challenge arises from leftover adhesive residue, which can negatively impact device reliability.

To combat this issue, manufacturers meticulously measure and manage the sliding angle of the packaging material during application. This precise control ensures that the liquid adhesive smoothly glides away, leaving no unwanted residue behind. This optimization delivers two key benefits: firstly, it significantly reduces the risk of electrical shorts or unintended connections, and secondly, it effectively boosts the overall electrical performance of the device.

Réduire les résidus d’adhésif dans l’emballage

Managing Receding Meniscus in Immersion Lithography

To achieve successful immersion lithography, meticulous management of the immersion fluid is crucial. A major failure point is the receding meniscus event, which leaves residual liquid behind on the wafer as a thin film or droplets. Ideally, the immersion fluid should be confined near the lens, allowing the wafer to scan smoothly during exposure.

For a semiconductor manufacturer, the meniscus failure mechanism remained a significant hurdle, hindering the successful implementation of immersion lithography. Recognizing the critical role of surface forces in drainage and pattern collapse during lithography, they sought a solution from a laboratory. The scientists, understanding the importance, developed a new fluid formulation with precisely tailored surface tension characteristics that facilitated proper liquid drainage, eliminating the meniscus issue.

Managing Receding Meniscus in Immersion Lithography

Nous sommes vos partenaires dans la résolution de votre activité et de votre Défis

Si vous êtes intéressé par la mise en œuvre de ces applications ou de toute autre application, veuillez nous contacter.

Chapitre 7 : Normes et lignes directrices

In an industry where precision reigns supreme, how can Semiconductors manufacturers ensure their products withstand scrutiny? The answer lies in standards and guidelines: the compass that guides them through the complex maze of quality and performance.

SEMI/ASTM D7490-13 (Reapproved 2022) — Solid Surface Tension (Surface Free Energy) by Two‑Liquid Contact Angle

What it is

Standard practice for estimating a solid’s total surface free energy and separating it into dispersive and polar components by measuring sessile‑drop contact angles of two probe liquids (one polar, one non‑polar) of known surface tension on the surface. It is intended as a quantitative, comparative surface‑readiness metric for wetting/adhesion process control within an approximate applicable range of ~20–60 mN/m.

When to use it

Pre‑print/coat/bond readiness checks

Use fixed‑time contact angles plus calculated γ components to confirm surface cleaning/treatment/priming is within a validated “pass band” before committing to downstream trials.

Process tuning & troubleshooting

Trend γs,polar/γs,dispersive and spot‑to‑spot variability to diagnose under‑treatment, contamination, non‑uniform treatment, or material/lot shifts.

In-scope / Out-of-scope

In scope
  • Substrates/coatings and pigment disks/coupons where sessile drops can be imaged and fit.
  • Two‑liquid contact angle measurements using a defined polar and non‑polar liquid set (commonly water + diiodomethane).
  • Calculation of γs,total and its components (γs,dispersive and γs,polar) using a stated model (e.g., Owens–Wendt / Fowkes‑type).
  • Comparative, protocol‑controlled measurements for QC/process control and investigation.
Out of scope
  • Downstream performance qualification (e.g., peel strength, print quality, environmental aging)—these must be validated separately.
  • Universal “material constants”: results are liquid‑set/model/protocol dependent and should not be compared across different methods without equivalence work.
  • Porous/swelling/absorbing solids without time controls: time‑dependent angles require a defined capture time and QC rules to be meaningful.
  • Liquid surface tension measurement or surface chemistry identification: use other methods/standards for those needs.

Minimum you must report (checklist)

  • Substrate/coating description + history: material, finish, lot, treatment/primer/cleaning steps, side/orientation, and region definition.
  • Probe liquids: identity (polar vs non‑polar), grade/source, lot/date opened, and contamination/purity handling.
  • Measurement geometry + method: sessile drop contact angle; imaging and fitting approach used.
  • Droplet volume + dosing controls: target volume (µL) and how dispensing accuracy is verified/controlled.
  • Capture timepoint + environment: θ @ fixed time (e.g., 2.0 s ± tolerance), temperature, and relative humidity.
  • Replicates + statistics: number of spots per liquid and reporting statistic (e.g., median + IQR), including same‑side/region rules.
  • Measured angles + QC rules: θpolar and θnon‑polar, acceptance criteria, and documentation of any rejected/re‑run spots.
  • Calculated outputs + assumptions: γs,total, γs,dispersive, γs,polar, plus the model and liquid set used for calculation.

This method provides an image‑backed, quantitative surface‑readiness signal but does not by itself guarantee adhesion or print performance. Any pass/fail gates must be calibrated per material family + treatment recipe + ink/adhesive system by correlating D7490 outputs to your downstream KPI.

How to interpret results (guardrails)

  • Use as a controlled comparative metric: keep the protocol fixed and do not mix models or liquid sets when trending or setting limits.
  • Focus on γs,polar for treatment sensitivity (with controls): interpret trends relative to your “golden sample” and validated pass band, not as a standalone promise of adhesion.
  • Treat variability as a first‑class signal: high IQR/spot‑to‑spot spread often indicates non‑uniform treatment or contamination even when the median looks acceptable.
  • Respect applicability and time dependence: if angles change with time due to absorption/swelling, only compare results at the defined capture time and flag unstable droplets for re‑test.

Maintenant, c’est à votre tour

We hope this guide showed you how to apply surface science in the Semiconductors industry.

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